On 18 October 2024, MIMOS Berhad organised a specialised seminar focused on X-ray metrology solutions for semiconductor and electronic devices, the unsung hero of semiconductor and electronic device manufacturing.
This event brought together industry experts, researchers, and engineers to discuss the latest advancements in X-ray metrology techniques and their applications.
X-ray metrology plays a crucial role in ensuring quality, accuracy, and efficiency at every stage of the manufacturing process. From non-destructive testing to high-resolution imaging and precise wafer inspection, this technology is revolutionising design and fabrication techniques.
The session introduced two ground-breaking Rigaku X-ray Metrology Solutions that led the way in:
- Accurate Measurements
- Material Characterisation
- Process Optimisation
By providing a platform for knowledge sharing and collaboration, MIMOS aims to advance the field of X-ray metrology and contribute to the development of cutting-edge semiconductor and electronic devices.
