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2024-issue-4Technology Insights

MIMOS’ free-of-charge training on TESCAN Plasma FIB-SEM to expedite failure analysis

MIMOS Berhad in KL and Kulim conducted an exclusive training on 6 November 2024, introducing the TESCAN Plasma FIB-SEM, a cutting-edge tool designed to revolutionise semiconductor failure analysis and R&D laboratories.

The session was a must-attend event for professionals in the semiconductor, automotive, aerospace industries, and related research fields. It showcased how the synergy between Plasma FIB-SEM and laser ablation can supercharge workflow, offering large-volume material removal and reducing time-to-result by thousands of times.

Participants explored first-hand how they can gain the ability to uncover root causes faster and with greater precision.