MIMOS Berhad in KL and Kulim conducted an exclusive training on 6 November 2024, introducing the TESCAN Plasma FIB-SEM, a cutting-edge tool designed to revolutionise semiconductor failure analysis and R&D laboratories.
The session was a must-attend event for professionals in the semiconductor, automotive, aerospace industries, and related research fields. It showcased how the synergy between Plasma FIB-SEM and laser ablation can supercharge workflow, offering large-volume material removal and reducing time-to-result by thousands of times.
Participants explored first-hand how they can gain the ability to uncover root causes faster and with greater precision.