On 6 September 2023, MIMOS held its Tech Talk on ‘The Eye Behind Microscopy Solutions for Semiconductor Research and Failure Analysis’ at MIMOS Auditorium. The two-session workshop invited three speakers to discuss topics related to failure analysis and semiconductor material applications.
Tech Talk: The Eye Behind Microscopy Solutions for Semiconductor Research and Failure Analysis
One of the invited speakers is MIMOS’ respective Failure Analysis Engineer, Mr. Wan Mohd. Tasyrif Wan Yaakob from the Semiconductor Technology Centre (STC). His speech during the first session centred on, ‘MIMOS’ Failure Analysis and Case Studies on Light Microscopy’ where he highlighted MIMOS’ innovative approaches in failure analysis and shared practical insights, real-world challenges, and strategies prepared by STC.
His talk was accompanied by two other speeches from esteemed guests, Dr Lim Siang Hui from ZEISS and Mr Royston Teo from GATAN APAC.
Afterwards, the second session held an interactive workshop on LSM & Axioscope and it ended with a brief lab tour of MIMOS’ Failure Analysis facilities. Invited to the tech talk are MIMOSians and external audiences where discussions on semiconductors and failure analysis significantly prospered.
